The electron beam is concentrated by the use of one or two condenser lenses. An objective lens initially magnifies the image which is further enlarged by the use of one or more projector lenses in the same way the eye-piece lens does in a light microscope.
The enlarged image can be flashed on a fluorescent screen which is then photographed. The photograph (electron micrograph) is later interpreted to bring home the characteristic features.
The specimen used for TEM studies has to be processed prior to microscopy. This is done by staining thin specimens (80 nm or less) with heavy metals such as uranium, osmium or lead. When these dense elements are present, electrons are scattered from the beam resulting in dark images on the fluorescent screen or in electron micrographs.
Individual cells may be affixed to thin electron micrographs. Individual cells may be affixed to thin electron-transparent films and stained with heavy metals stains. However, tissues must be fixed in a suitable fixative
Basic Optical Features
| A. Inverted Light Micrscope |
B. Transmission Electron Micrscope |
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A |
B |
| 1. Lamp |
1. Electron gun |
| 2. Condenser lens |
2. Condenser lens |
| 3. Specimen Plane |
3. Specimen plane |
| 4. Objective lens |
4. Objective lens |
| 5. Intermediate Image plane |
5. Projector lens system |
| 6. Ocular |
6. Fluorescent screen |
| 7. Photographic plate or the eye |
7. Intermediate image planes |
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8. Binocular viewer |
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